Measuring deeper learning through cognitively demanding test items : results from the analysis of six national and international exams

Measuring deeper learning through cognitively demanding test items results from the analysis of six national and international exams

Bibliographic Details
Other Authors: Yuan, Kun, author (author), Le, Vi-Nhuan, author
Format: eBook
Language:Inglés
Published: Santa Monica, California : RAND Corporation 2014.
Subjects:
Achievement tests > United States.
Critical thinking.
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009421476906719
Description
Physical Description:1 online resource (119 pages)
Bibliography:Includes bibliographical references.
ISBN:9780833085528

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