Cita APA (7a ed.)

Yuan, K., & Le, V. (2014). Measuring deeper learning through cognitively demanding test items: Results from the analysis of six national and international exams. RAND Corporation.

Cita Chicago Style (17a ed.)

Yuan, Kun, y Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. Santa Monica, California: RAND Corporation, 2014.

Cita MLA (9a ed.)

Yuan, Kun, y Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation, 2014.

Precaución: Estas citas no son 100% exactas.