Yuan, K., & Le, V. (2014). Measuring deeper learning through cognitively demanding test items: Results from the analysis of six national and international exams. RAND Corporation.
Cita Chicago Style (17a ed.)Yuan, Kun, y Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. Santa Monica, California: RAND Corporation, 2014.
Cita MLA (9a ed.)Yuan, Kun, y Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation, 2014.
Precaución: Estas citas no son 100% exactas.