A bibliography on methods for the measurement of inhomogeneities in semiconductors (1953-1967)

Bibliographic Details
Main Authors: Schafft, Harry A. (-), Needham, Susan Gayle (Author)
Format: Book
Language:Inglés
Published: Washington, D. C., 1968
Series:Technical note / National Bureau of Standards ; 445
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991009560329708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:45 S.