Scanning and transmission electron microscopy an introduction

Bibliographic Details
Main Author: Flegler, Stanley L. (-)
Other Authors: Heckman, John William, Klomparens, Karen L.
Format: Book
Language:Inglés
Published: New York : Oxford University Press cop. 1993 [reimp. 1995].
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991006854799708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Item Description:Pub. originalmente en: New York : W.H. Freeman, c1993.
Physical Description:viii, 225 p. : il. ; 26 cm
Bibliography:Incluye referencias bibliográficas e índice.
ISBN:9780195107517