Electron microscopy and analysis

Bibliographic Details
Main Author: Goodhew, Peter J. (-)
Other Authors: Humphreys, John, Beanland, R.
Format: Book
Language:Inglés
Published: London ; New York : Taylor & Francis cop. 2001
Edition:3rd ed
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991006854459708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:x, [2], 251 p. : il. ; 24 cm
Bibliography:Incluye referencias bibliográficas (p. [236]-237) e índice
ISBN:9780748409686