Cita APA (7a ed.)

Goodhew, P. J., Humphreys, J., & Beanland, R. (2001). Electron microscopy and analysis (3rd ed.). Taylor & Francis.

Cita Chicago Style (17a ed.)

Goodhew, Peter J., John Humphreys, y R. Beanland. Electron Microscopy and Analysis. 3rd ed. London ; New York: Taylor & Francis, 2001.

Cita MLA (9a ed.)

Goodhew, Peter J., et al. Electron Microscopy and Analysis. 3rd ed. Taylor & Francis, 2001.