Materials Reliability in Microelectronics VII : Symposium held March 31-April 3, 1997, San Francisco, California, U.S.A

Materials Reliability in Microelectronics VII Symposium held March 31-April 3, 1997, San Francisco, California, U.S.A

Bibliographic Details
Corporate Author: Materials Research Society (-)
Other Authors: Clement, J. Joseph (-)
Format: Book
Language:Inglés
Published: Pittsburgh : Materials Research Society c1997.
Series:Materials Research Society symposium proceedings ; v. 473
Subjects:
Materiales > Propiedades mecánicas
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991002387589708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:xv, 457 p. : il. ; 24 cm
Bibliography:Incluye referencias bibliográficas e índices
ISBN:9781558993778

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