Measurement techniques for thin films

Bibliographic Details
Main Author: Schwartz, Bertram (-)
Other Authors: Schwartz, Newton
Format: Book
Language:Inglés
Published: New York : Electrochemical Society 1967
Edition:1a ed
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991001983969708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:364 p.