Microelectronic reliability. Vol.: II integrity assessment and assurance

Bibliographic Details
Main Author: Pollino, Emiliano (-)
Format: Book
Language:Inglés
Published: Boston : Artech House Books 1989
Edition:1a ed
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991001552199708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:537 p.
ISBN:9780890063507