Marcus, R., & Sheng, T. (1983). Transmission electron microscopy of silicon vlsi circuits and structures (1a ed.). Wiley Interscience Journals.
Cita Chicago Style (17a ed.)Marcus, R.B, y T.T Sheng. Transmission Electron Microscopy of Silicon Vlsi Circuits and Structures. 1a ed. New York: Wiley Interscience Journals, 1983.
Cita MLA (9a ed.)Marcus, R.B, y T.T Sheng. Transmission Electron Microscopy of Silicon Vlsi Circuits and Structures. 1a ed. Wiley Interscience Journals, 1983.
Precaución: Estas citas no son 100% exactas.