Cita APA (7a ed.)

Institute of Electrical and Electronics Engineers. (2019). Proceedings of the 4th International Workshop on Metamorphic Testing. IEEE.

Cita Chicago Style (17a ed.)

Institute of Electrical and Electronics Engineers. Proceedings of the 4th International Workshop on Metamorphic Testing. Piscataway, NJ, USA: IEEE, 2019.

Cita MLA (9a ed.)

Institute of Electrical and Electronics Engineers. Proceedings of the 4th International Workshop on Metamorphic Testing. IEEE, 2019.