Proceedings of the 4th International Workshop on Metamorphic Testing

MET 2019 provides a good forum for discussing novel ideas, new perspectives, new applications, and the state of research, related to or inspired by metamorphic testing. This workshop aims to bring together researchers and practitioners in both academia and industry to discuss their research results,...

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Detalles Bibliográficos
Autor principal: Institute of Electrical and Electronics Engineers (author)
Autor Corporativo: Institute of Electrical and Electronics Engineers, author, issuing body (author)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Piscataway, NJ, USA : IEEE 2019.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009714605906719
Descripción
Sumario:MET 2019 provides a good forum for discussing novel ideas, new perspectives, new applications, and the state of research, related to or inspired by metamorphic testing. This workshop aims to bring together researchers and practitioners in both academia and industry to discuss their research results, experiences and insights into metamorphic testing.
Descripción Física:1 online resource