MET 2018 : 2018 ACM/IEEE 3rd International Workshop on Metamorphic Testing : proceedings : 27 May 2018, Gothenburg, Sweden

MET 2018 2018 ACM/IEEE 3rd International Workshop on Metamorphic Testing : proceedings : 27 May 2018, Gothenburg, Sweden

Bibliographic Details
Main Author: IEEE Computer Society (author)
Corporate Authors: IEEE Computer Society, author (author), Association for Computing Machinery-Digital Library (-)
Format: eBook
Language:Inglés
Published: Los Alamitos, California : IEEE Computer Society 2018.
Series:ACM Conferences
Subjects:
Computer software > Testing > Congresses.
Software engineering > Congresses.
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009714292106719
Description
Physical Description:1 online resource (55 pages)
ISBN:9781450357296

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