SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA

SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA

Detalles Bibliográficos
Autor principal: Misra, Vishal (-)
Autores Corporativos: International Conference on Measurement and Modeling of Computer Systems Corporate Author (corporate author), International Conference on Measurement and Modeling of Computer Systems (-), ACM-Sigmetrics Content Provider (content provider)
Formato: Libro electrónico
Idioma:Inglés
Publicado: [Place of publication not identified] ACM 2010
Colección:ACM Conferences
Materias:
Engineering & Applied Sciences
Computer Science
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009714172406719
Descripción
Notas:Bibliographic Level Mode of Issuance: Monograph
Descripción Física:1 online resource (386 pages)

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