7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California

Detalles Bibliográficos
Autor principal:	International Symposium on Quality Electronic Design (corporate author, -)
Autores Corporativos:	International Symposium on Quality Electronic Design Corporate Author (corporate author), IEEE Electron Devices Society Content Provider (content provider), Components, Packaging & Manufacturing Technology Society Content Provider, IEEE Circuits and Systems Society Content Provider
Formato:	Libro electrónico
Idioma:	Inglés
Publicado:	[Place of publication not identified] : IEEE Computer Society 2006.
Colección:	ACM Conferences.
Materias:	Integrated circuits > Reliability > Very large scale integration > Congresses Integrated circuits > Very large scale integration > Design and construction > Congresses Integrated circuits > Computer-aided design > Very large scale integration > Congresses Integrated circuits > Testing > Quality control > Very large scale integration > Congresses Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering
Ver en Biblioteca Universitat Ramon Llull:	https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009713985106719

Descripción
Notas:	Bibliographic Level Mode of Issuance: Monograph
ISBN:	9781509094592

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