SIGMETRICS '17 abstracts proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems : June 5-9, 2017, Urbana-Champaign, IL, USA

Bibliographic Details
Corporate Authors: International Conference on Measurement and Modeling of Computer Systems (-), ACM-Sigmetrics, sponsoring body (sponsoring body)
Format: eBook
Language:Inglés
Published: New York : ACM 2017.
Series:ACM Conferences
Subjects:
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009713730206719
Description
Item Description:Includes index.
Physical Description:1 online resource (72 pages)