SIGMETRICS '17 abstracts : proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems : June 5-9, 2017, Urbana-Champaign, IL, USA

SIGMETRICS '17 abstracts proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems : June 5-9, 2017, Urbana-Champaign, IL, USA

Detalles Bibliográficos
Autores Corporativos: International Conference on Measurement and Modeling of Computer Systems (-), ACM-Sigmetrics, sponsoring body (sponsoring body)
Formato: Libro electrónico
Idioma:Inglés
Publicado: New York : ACM 2017.
Colección:ACM Conferences
Materias:
Computer systems > Evaluation > Congresses.
Computer systems > Computer simulation > Congresses.
Electronic digital computers > Evaluation > Congresses.
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009713730206719
Descripción
Notas:Includes index.
Descripción Física:1 online resource (72 pages)

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