SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada

SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada

Detalles Bibliográficos
Autor principal: International Conference on Measurement and Modeling of Computer Systems (corporate author, -)
Autores Corporativos: International Conference on Measurement and Modeling of Computer Systems Corporate Author (corporate author), ACM-Sigmetrics Content Provider (content provider)
Formato: Libro electrónico
Idioma:Inglés
Publicado: [Place of publication not identified] ACM 2005
Colección:ACM Conferences
Materias:
Electrical & Computer Engineering
Engineering & Applied Sciences
Telecommunications
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009713648806719
Descripción
Notas:Bibliographic Level Mode of Issuance: Monograph
Descripción Física:1 online resource (416 pages)

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