MET 2017 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing : proceedings : 22 May 2017, Buenos Aires, Argentina

Bibliographic Details
Corporate Authors: IEEE Computer Society, sponsoring body (sponsoring body), Association for Computing Machinery, sponsoring body
Format: eBook
Language:Inglés
Published: Piscataway, New Jersey : IEEE Press 2017.
Series:ACM Conferences
Subjects:
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009712867806719
Description
Item Description:Includes index.
Physical Description:1 online resource (56 pages)
ISBN:9781538604243