| Sumario: | In recent years, microwave sensing and imaging have acquired an ever-growing importance in several applicative fields, such as non-destructive evaluations in industry and civil engineering, subsurface prospection, security, and biomedical imaging. Indeed, microwave techniques allow, in principle, for information to be obtained directly regarding the physical parameters of the inspected targets (dielectric properties, shape, etc.) by using safe electromagnetic radiations and cost-effective systems. Consequently, a great deal of research activity has recently been devoted to the development of efficient/reliable measurement systems, which are effective data processing algorithms that can be used to solve the underlying electromagnetic inverse scattering problem, and efficient forward solvers to model electromagnetic interactions. Within this framework, this Special Issue aims to provide some insights into recent microwave sensing and imaging systems and techniques.
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