Materials characterization introduction to microscopic and spectroscopic methods

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and...

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Detalles Bibliográficos
Autor principal: Leng, Y. (-)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Singapore ; Hoboken, NJ : J. Wiley c2008.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009665116306719
Descripción
Sumario:This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fl
Notas:Description based upon print version of record.
Descripción Física:1 online resource (351 p.)
Bibliografía:Includes bibliographical references and index.
ISBN:9786612031403
9780470822999
9780470823002