Materials characterization introduction to microscopic and spectroscopic methods
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and...
Autor principal: | |
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Formato: | Libro electrónico |
Idioma: | Inglés |
Publicado: |
Singapore ; Hoboken, NJ :
J. Wiley
c2008.
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Materias: | |
Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009665116306719 |
Sumario: | This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fl |
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Notas: | Description based upon print version of record. |
Descripción Física: | 1 online resource (351 p.) |
Bibliografía: | Includes bibliographical references and index. |
ISBN: | 9786612031403 9780470822999 9780470823002 |