Thin film analysis by X-ray scattering
With contributions by Paul F. Fewster and Christoph GenzelWhile X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thi...
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| Otros Autores: | , |
| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Weinheim :
Wiley-VCH
c2006.
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| Materias: | |
| Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009665111506719 |
| Sumario: | With contributions by Paul F. Fewster and Christoph GenzelWhile X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.Grain size, porosity, density, preferred orientation and other properties are important t |
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| Notas: | Description based upon print version of record. |
| Descripción Física: | 1 online resource (380 p.) |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9781280854125 9786610854127 9783527607594 9783527607044 |
