Fundamental principles of engineering nanometrology

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

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Detalles Bibliográficos
Otros Autores: Leach, R. K., author (author)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Oxford, England : William Andrew 2014.
Edición:2nd ed
Colección:Micro & nano technologies.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009629540406719

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