Descripción
| Sumario: | Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardiza
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| Notas: | "First published 2010"--T. p. verso. |
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| Descripción Física: | 1 online resource ( xxi, 361 p.) |
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| Bibliografía: | Includes bibliographical references at the end of each chapters and index. |
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| ISBN: | 9781455777501 |
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