Unified methods for VLSI simulation and test generation
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | Inglés |
| Published: |
Boston :
Kluwer Academic Publishers
cop. 1989
|
| Series: | Kluwer international series in engineering and computer science ;
SECS73 |
| Subjects: | |
| See on Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991007605109706719 |
| Item Description: | At head of title: AT&T |
|---|---|
| Physical Description: | xii, 148 p. : ill. ; 24 cm |
| Bibliography: | Bibliografia: p. [113]-143 Inclou índex |
| ISBN: | 9780792390251 |
