Densiometry in thin layer chromatography practice and applications

Bibliographic Details
Other Authors: Touchstone, Joseph C. , ed (ed), Sherma, Joseph, ed
Format: Book
Language:Inglés
Published: New York [etc.] : John Wiley & Sons 1979
Subjects:
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991002851669706719
Description
Item Description:Índex
Physical Description:XV, 747 p. : il.; 23 cm
Bibliography:Referències bibliogràfiques a cada capítol
ISBN:9780471880417