Technostress coping with technology @work home @play

Bibliographic Details
Main Author: Weil, Michelle M. (-)
Other Authors: Rosen, Larry D.
Format: 991009667936506719
Language:Inglés
Published: New York : John Wiley & Sons cop. 1997
Subjects:
See on Biblioteca Pública Episcopal del Seminario de Barcelona:https://csuc-instb.primo.exlibrisgroup.com/discovery/search?query=any,contains,991002972426706707&tab=BPEBcat&search_scope=BPEB&vid=34CSUC_INSTB:BPEB&offset=0
Description
Physical Description:xiii, 240 p.; 23 cm
Bibliography:Inclou referències bibliogràfiques (pàgines 221-231). Índex
ISBN:9780471177098