Tabla de Contenidos: “…Wirewound -- Precision Resistors -- Resistor Networks -- 3.1.2 TOLERANCING -- Basic Statistical Behavior -- Modeling Distributions -- Tolerance Variations -- 3.1.3 TEMPERATURE COEFFICIENT -- 3.1.4 POWER -- 3.1.5 INDUCTANCE -- 3.1.6 PULSE HANDLING -- Limiting Element Voltage -- 3.1.7 EXTREME VALUES -- Very Low Values -- Very High Values -- 3.1.8 FUSIBLE AND SAFETY RESISTORS -- 3.1.9 RESISTOR NETWORKS -- Production Efficiency -- Value Tracking: Thick Film Versus Thin Film -- 3.2 POTENTIOMETERS -- 3.2.1 TRIMMER TYPES -- Carbon -- Cermet -- Wirewound -- Multiturn -- 3.2.2 PANEL TYPES -- Carbon, Cermet, and Wirewound -- Conductive Plastic -- 3.2.3 POT APPLICATIONS -- Use as a Rheostat -- Adjustability -- Law Accuracy -- Manufacturing Processes -- 3.3 CAPACITORS -- 3.3.1 METALIZED FILM AND PAPER -- Polyester -- Polycarbonate -- Polypropylene and Polystyrene -- Metalized Paper -- 3.3.2 MULTILAYER CERAMICS -- COG -- X5R and X7R -- Y5V and Z5U -- 3.3.3 SINGLE-LAYER CERAMICS -- Barrier Layer -- Low-K and High-K Dielectrics -- 3.3.4 ELECTROLYTICS -- Construction -- Leakage -- Ripple Current and Equivalent Series Resistance -- Temperature and Lifetime -- Size and Weight -- 3.3.5 SOLID TANTALUM -- Tantalum Chip Capacitors -- 3.3.6 CAPACITOR APPLICATIONS -- Value Shifts -- 3.3.7 SERIES CAPACITORS AND DC LEAKAGE -- Adding Bleed Resistors -- 3.3.8 DIELECTRIC ABSORPTION -- 3.3.9 SELF-RESONANCE -- Consequences of Self-Resonance -- 3.4 INDUCTORS -- 3.4.1 PERMEABILITY -- Ferrites -- Iron Powder -- 3.4.2 MAGNETIC MATERIAL DEFINITIONS AND METRICS -- Hysteresis Loop Definitions -- Hysteresis Loop Metrics -- 3.4.3 INDUCTOR APPLICATIONS -- Tuned Circuits -- Power Circuits -- Suppression -- Leakage Inductance -- Measurement Methods -- Numerical Methods -- Issues With Unusual Winding Configurations -- 3.4.4 SELF-CAPACITANCE -- Measurement Methods -- 3.4.5 WINDING LOSSES…”