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487Publicado 1993Materias:Libro electrónico
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488
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489por Tsujimura, TakatoshiTabla de Contenidos: “…6.4.1 Performance Target 6.4.2 High-Yield Manufacturing by White + Color Filter Method; 6.5 NEXT-GENERATION TFT TECHNOLOGIES FOR OLED DISPLAY; 6.5.1 Sequential Lateral Solidification (SLS) Method; 6.5.2 Microcrystalline and Superamorphous Silicon; 6.5.3 Solid-Phase Crystallization; 6.5.4 Oxide Semiconductors; 7: OLED Lighting; 7.1 COLOR RENDERING INDEX; 7.2 OLED LIGHTING REQUIREMENT; 7.2.1 Correlated Color Temperature (CCT); 7.2.2 Other Requirements; 7.3 LIGHT EXTRACTION ENHANCEMENT; 7.3.1 Microlens Array Structure; 7.3.2 Diffusion Structure; 7.3.3 Diffraction Structure…”
Publicado 2012
Libro electrónico -
490Publicado 2009Materias: “…Semiconductor production equipment industry Management…”
Universidad Loyola - Universidad Loyola Granada (Otras Fuentes: Biblioteca de la Universidad Pontificia de Salamanca)Enlace del recurso
Libro electrónico -
491por Mack, Raymond A.Tabla de Contenidos: “…Film Resistors Wire Resistors; Chapter Seven: Semiconductor Selection; Diode Characteristics; Junction Diodes; Schottky Diodes; Passivation; Bipolar Transistors; Power MOSFETs; Gate Drive; Safe Operating Area and Avalanche Rating; Synchronous Rectification; Sense FETs; Package Options; IGBT Devices; Chapter Eight: Inductor Selection; Properties of Real Inductors; Core Properties; Designing a Powder Toroid Choke Core; Choosing a Boost Converter Core; Chapter Nine: Transformer Selection; Transformer Properties; Safety Concerns; Practical Construction Considerations…”
Publicado 2005
Libro electrónico -
492por Baker, R. Jacob, 1964-Materias: “…Semiconductores diseño y construcción…”
Publicado 1998
Biblioteca Universidad de Deusto (Otras Fuentes: Biblioteca de la Universidad de Navarra)Libro -
493Publicado 2015Tabla de Contenidos: “…Preface / Luigi Dei -- Foreword / Enrico Del Re -- Introduction / Gianfranco Manes, Giuseppe Pelosi -- The IEEE Milestones Program / Ermanno Cardelli -- Part I Enrico Fermi and Semiconductor Electronics -- Enrico Fermi in Florence / Giuseppe Pelosi, Massimiliano Pieraccini, Stefano Selleri -- On the origin of Fermi-Dirac Statistics / Giuseppe Pelosi, Massimiliano Pieraccini -- From Fermi-Dirac Statistics to the Invisible Electronics / Gianfranco Manes -- The Role Played by Fermi Statistics in the Evolution of Micro- and Nanoelectronics / Giorgio Baccarani -- Part II On the Quantization of an Ideal Monoatomic Gas Reproduction of the original papers, in Italian and German, by Enrico Fermi -- E. …”
Libro electrónico -
494Publicado 1995Materias:Tesis
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495
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496
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497
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498Publicado 2014Tabla de Contenidos: “…1.12 SummaryChapter 2 Power Converters and Power Management ICs; 2.1 Dynamic Voltage Scaling for VLSI Power Management; 2.2 Integrated DC/DC Converters; 2.3 Summary; Chapter 3 Semiconductor Industry and More than Moore; 3.1 Semiconductor Industry; 3.2 History of the Semiconductor Industry; 3.3 Food Chain Pyramid of the Semiconductor Industry; 3.4 Semiconductor Companies; 3.5 More than Moore; Chapter 4 Smart Power IC Technology; 4.1 Smart Power IC Technology Basics; 4.2 Smart Power IC Technology: Historical Perspective; 4.3 Smart Power IC Technology: Industrial Perspective…”
Libro electrónico -
499por Manasreh, Mahmoud OmarTabla de Contenidos: “…INTRODUCTION TO NANOMATERIALS AND DEVICES; CONTENTS; Preface; Fundamental Constants; 1 Growth of Bulk, Thin Films, and Nanomaterials; 1.1 Introduction; 1.2 Growth of Bulk Semiconductors; 1.2.1 Liquid-Encapsulated Czochralski (LEC) Method; 1.2.2 Horizontal Bridgman Method; 1.2.3 Float-Zone Growth Method; 1.2.4 Lely Growth Method; 1.3 Growth of Semiconductor Thin Films; 1.3.1 Liquid-Phase Epitaxy Method; 1.3.2 Vapor-Phase Epitaxy Method; 1.3.3 Hydride Vapor-Phase Epitaxial Growth of Thick GaN Layers; 1.3.4 Pulsed Laser Deposition Technique; 1.3.5 Molecular Beam Epitaxy Growth Technique…”
Publicado 2012
Libro electrónico -
500Publicado 2014Tabla de Contenidos: “…2.3 Characterization of SOI wafers using the pseudo-metal oxide semiconductor field effect transister (MOSFET) technique2.4 Developments in the pseudo-MOSFET technique; 2.5 Conventional methods for the characterization of FD MOSFETs; 2.6 Advanced methods for the characterization of FD MOSFETs; 2.7 Characterization of ultrathin SOI MOSFETs; 2.8 Characterization of multiple-gate MOSFETs; 2.9 Characterization of nanowire FETs; 2.10 Conclusions; 2.11 Acknowledgments; 2.12 References…”
Libro electrónico