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501
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502por Mack, Raymond A.Tabla de Contenidos: “…Film Resistors Wire Resistors; Chapter Seven: Semiconductor Selection; Diode Characteristics; Junction Diodes; Schottky Diodes; Passivation; Bipolar Transistors; Power MOSFETs; Gate Drive; Safe Operating Area and Avalanche Rating; Synchronous Rectification; Sense FETs; Package Options; IGBT Devices; Chapter Eight: Inductor Selection; Properties of Real Inductors; Core Properties; Designing a Powder Toroid Choke Core; Choosing a Boost Converter Core; Chapter Nine: Transformer Selection; Transformer Properties; Safety Concerns; Practical Construction Considerations…”
Publicado 2005
Libro electrónico -
503Publicado 1995Materias:Tesis
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504
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505
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506Publicado 2014Tabla de Contenidos: “…1.12 SummaryChapter 2 Power Converters and Power Management ICs; 2.1 Dynamic Voltage Scaling for VLSI Power Management; 2.2 Integrated DC/DC Converters; 2.3 Summary; Chapter 3 Semiconductor Industry and More than Moore; 3.1 Semiconductor Industry; 3.2 History of the Semiconductor Industry; 3.3 Food Chain Pyramid of the Semiconductor Industry; 3.4 Semiconductor Companies; 3.5 More than Moore; Chapter 4 Smart Power IC Technology; 4.1 Smart Power IC Technology Basics; 4.2 Smart Power IC Technology: Historical Perspective; 4.3 Smart Power IC Technology: Industrial Perspective…”
Libro electrónico -
507Publicado 2014Tabla de Contenidos: “…2.3 Characterization of SOI wafers using the pseudo-metal oxide semiconductor field effect transister (MOSFET) technique2.4 Developments in the pseudo-MOSFET technique; 2.5 Conventional methods for the characterization of FD MOSFETs; 2.6 Advanced methods for the characterization of FD MOSFETs; 2.7 Characterization of ultrathin SOI MOSFETs; 2.8 Characterization of multiple-gate MOSFETs; 2.9 Characterization of nanowire FETs; 2.10 Conclusions; 2.11 Acknowledgments; 2.12 References…”
Libro electrónico -
508por Rashid, Muhammad H.Materias:
Publicado 1995Biblioteca Universidad de Deusto (Otras Fuentes: Biblioteca de la Universidad de Navarra)Libro -
509
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510Publicado 2009Tabla de Contenidos: “…Semiconductor physics review for MOSFET modeling -- Ideal metal oxide semiconductor capacitor -- Non-ideal and non-classical MOS capacitors -- Long channel MOS transistor -- The scaled MOS transistor -- Quasistatic, non-quasistatic, and noise models -- Quantum phenomena in MOS transistors -- Non-classical MOSFET structures -- Appendix A : expression for electric field and potential variation in the semiconductor space charge under the gate -- Appendix B : features of select compact MOSFET models -- Appendix C : PSP two-point collocation method…”
Libro electrónico -
511
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512por Robinson, RonMaterias: “…Harris Semiconductor gestión de la calidad total…”
Publicado 1995
Libro -
513
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514
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515Publicado 2016Tabla de Contenidos: “…1.5 Challenges to Ultralow-Power Semiconductor Device Operation1. Introduction ; 2. …”
Libro electrónico -
516
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517
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518
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519
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520
