Materias dentro de su búsqueda.
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- 3C-SiC 1
- 4H-SiC 1
- 4H-SiC, epitaxial layer
- 6H-SiC 1
- Berkovich indenter 1
- Engineering 1
- FEM 1
- History 1
- MEA 1
- MEMS devices 1
- MESFET 1
- PAE 1
- Raman spectroscopy 1
- Rutherford backscattering spectrometry (RBS) 1
- Schottky barrier 1
- SiC 1
- SiC power electronic devices 1
- Technology 1
- Young's modulus 1
- aluminum nitride 1
- amorphous SiC 1
- bulge test 1
- bulk micromachining 1
- circular membrane 1
- cleavage strength 1
- critical depth of cut 1
- critical load 1
- deep level transient spectroscopy (DLTS) 1
- deformation 1
- doped SiC 1
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