Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devices
"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the sam...
Formato: | Libro electrónico |
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Idioma: | Inglés |
Materias: | |
Acceso en línea: | Acceso restringido con credenciales, usuarios UPSA |
Ver en Biblioteca de la Universidad Pontificia de Salamanca: | https://koha.upsa.es/cgi-bin/koha/opac-detail.pl?biblionumber=729408 |
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