Residual stress measurement by X-ray diffraction : SAE HS-784

Residual stress measurement by X-ray diffraction SAE HS-784

Bibliographic Details
Corporate Author: Society of Automotive Engineers (-)
Format: Book
Language:Inglés
Published: Warrendale, Pa. SAE International 2003
Edition:2003 Edition
Subjects:
Materiales > Técnicas de observación y análisis
Materiales.
Residual stresses.
X-rays > Industrial applications.
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991011576431308016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:84 páginas : Ilustraciones (blanco y negro) ; 28 cm
Bibliography:Incluye referencias bibliográficas (páginas 83-84) e índice
ISBN:9780768010695

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