Practical scanning electron microscopy : electron and ion microprobe analysis

Practical scanning electron microscopy electron and ion microprobe analysis

Bibliographic Details
Other Authors: Goldstein, Joseph I., edi. lit (edi lit), Yakowitz, Harvey, editor literario (editor literario), Newbury, D. E. (Dale E.), col (Collector), Everhart, T. E., prologuista (prologuista)
Format: Book
Language:Inglés
Published: New York [etc.] : Plenum Press 1977
Edition:3rd printing
Subjects:
Microscopios electrónicos computarizados
Microanálisis > Técnicas computarizadas.
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991003669189708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:XVIII, 582 p. : il. ; 24 cm
ISBN:9780306308208

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