Surface and interface characterization by electron optical methods

Surface and interface characterization by electron optical methods

Bibliographic Details
Main Author: OTAN. Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques.
Corporate Author: OTAN. Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques (-)
Other Authors: Howie, A., editor literario (editor literario), Valdrè, U., editor literario
Format: Book
Language:Inglés
Published: New York [etc.] : Plenum Press 1987
Series:NATO Advanced Science Institutes series. Physics ; 191
Subjects:
Superficies (Física) > Técnicas > Congresos, conferencias, etc.
Microscopios electrónicos > Congresos, conferencias, etc.
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991003296289708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:VIII, 319 p. : il. ; 26 cm
ISBN:9780306430862

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