IEEE Test symposium.Vlsi sistem test: Cost vs. Quality
| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Published: |
Atlantic City :
I.E.E.E
1990
|
| Edition: | 1a ed |
| Subjects: | |
| See on Universidad de Navarra: | https://unika.unav.edu/discovery/fulldisplay?docid=alma991002280199708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es |
| Physical Description: | - p. |
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