Cita APA (7a ed.)

Institute of Electrical and Electronics Engineers. (1990). IEEE Test symposium.Vlsi sistem test: Cost vs. Quality (1a ed.). I.E.E.E.

Cita Chicago Style (17a ed.)

Institute of Electrical and Electronics Engineers. IEEE Test Symposium.Vlsi Sistem Test: Cost Vs. Quality. 1a ed. Atlantic City: I.E.E.E, 1990.

Cita MLA (9a ed.)

Institute of Electrical and Electronics Engineers. IEEE Test Symposium.Vlsi Sistem Test: Cost Vs. Quality. 1a ed. I.E.E.E, 1990.