Electronics reliability and measurement technology

Bibliographic Details
Main Author: Heyman, Joseph S. (-)
Format: Book
Published: New Jersey : Noyes Publications 1988
Edition:1a ed
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991002100269708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:128 p.
ISBN:9780815511717