Heyman, J. S. (1988). Electronics reliability and measurement technology (1a ed.). Noyes Publications.
Chicago Style (17th ed.) CitationHeyman, Joseph S. Electronics Reliability and Measurement Technology. 1a ed. New Jersey: Noyes Publications, 1988.
MLA (9th ed.) CitationHeyman, Joseph S. Electronics Reliability and Measurement Technology. 1a ed. Noyes Publications, 1988.
Warning: These citations may not always be 100% accurate.