Nondestructive evaluation of semiconductor materials and devices

Bibliographic Details
Main Author: Zemel, Jay N. (-)
Format: Book
Language:Inglés
Published: New York : Plenum Publishing Corporation 1979
Edition:1a ed
Subjects:
See on Universidad de Navarra:https://unika.unav.edu/discovery/fulldisplay?docid=alma991001120049708016&context=L&vid=34UNAV_INST:VU1&search_scope=34UNAV_TODO&tab=34UNAV_TODO&lang=es
Description
Physical Description:782 p.
ISBN:9780306402937