APA (7th ed.) Citation

Howes, M., & Morgan, D. (1981). Reliability and degradation. Semiconductor devicesand circuits (1a ed.). John Wiley & Sons Limited.

Chicago Style (17th ed.) Citation

Howes, M.J, and D.V Morgan. Reliability and Degradation. Semiconductor Devicesand Circuits. 1a ed. Chichester: John Wiley & Sons Limited, 1981.

MLA (9th ed.) Citation

Howes, M.J, and D.V Morgan. Reliability and Degradation. Semiconductor Devicesand Circuits. 1a ed. John Wiley & Sons Limited, 1981.