Interferometría por corrimiento de fase para caracterizar materiales electro-ópticos

Bibliographic Details
Main Author: Rueda P., J. E. (-)
Corporate Author: e-libro, Corp (-)
Other Authors: Lasprilla, M. C.
Format: eArticle
Language:Castellano
Published: Pamplona, Colombia : Universidad de Pamplona 2006.
Subjects:
Online Access:https://recursos.uloyola.es/login?url=https://accedys.uloyola.es:8443/accedix0/sitios/ebook.php?id=5429
See on Universidad Loyola - Universidad Loyola Granada:https://colectivo.uloyola.es/Record/ELB5429
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Description
Published:Vol. 4, No. 1(2006)-
Physical Description:10-16 p.
Publication Frequency:Semestral
ISSN:01204211