Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devices

"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the sam...

Descripción completa

Detalles Bibliográficos
Autor principal: Epperlein, Peter W. (-)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Chichester, West Sussex, U.K. : John Wiley & Sons Inc 2013.
Materias:
Acceso en línea:https://recursos.uloyola.es/login?url=https://accedys.uloyola.es:8443/accedix0/sitios/ebook.php?id=178093
Ver en Universidad Loyola - Universidad Loyola Granada:https://colectivo.uloyola.es/Record/ELB178093
Solicitar por préstamo interbibliotecario: Correo

Ejemplares similares