Metric culture ontologies of self-tracking practices

Bibliographic Details
Other Authors: Ajana, Bithaj (-)
Format: Book
Language:Inglés
Published: Bingley [etc.] : Emerald 2018.
Edition:1st ed
Subjects:
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Description
Item Description:Conference "Metric culture: the quantified self and beyond", organised in June 2017 at the Aarhus Institute of Advanced Studies in Denmark.
Physical Description:XIX, 264 p. ; 24 cm
Bibliography:Bibliogr. Índice.
ISBN:9781787432901