Measuring dynamic capabilities practices and performance in semiconductor manufacturing

Bibliographic Details
Main Author: Macher, Jeffrey T. (-)
Other Authors: Mowery, David C.
Format: Book
Language:Inglés
Published: Oxford : Blackwell 2009.
Subjects:
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Description
Item Description:Fotocopia de : British Journal of Management, v. 20 (2009)
Physical Description:P. 41-62 : gráf. ; 30 cm
Bibliography:Bibliogr. : p. 61-62