Macher, J. T., & Mowery, D. C. (2009). Measuring dynamic capabilities: Practices and performance in semiconductor manufacturing. Blackwell.
Chicago Style (17th ed.) CitationMacher, Jeffrey T., and David C. Mowery. Measuring Dynamic Capabilities: Practices and Performance in Semiconductor Manufacturing. Oxford: Blackwell, 2009.
MLA (9th ed.) CitationMacher, Jeffrey T., and David C. Mowery. Measuring Dynamic Capabilities: Practices and Performance in Semiconductor Manufacturing. Blackwell, 2009.
Warning: These citations may not always be 100% accurate.