Built-in test design for the efficient testing of VLSI circuits
| Main Author: | |
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| Format: | Thesis |
| Language: | Inglés |
| Published: |
Ann Arbor :
University Microfilms International
1990, c1991.
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| Subjects: | |
| See on Universidad de Deusto: | https://oceano.biblioteca.deusto.es/primo-explore/search?query=any,contains,991003944309703351&tab=default_tab&search_scope=deusto_alma&vid=deusto |
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| Physical Description: | viii, 136 p. : il. ; 29 cm |
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| Bibliography: | Bibliogr.: p. 132-136. |
