Tests of random walk for Latin American stock markets additional evidence

Bibliographic Details
Main Author: Hasan, Tanweer (-)
Other Authors: Ma, Yulong, Kadapakkam, Palani-Rajan
Format: Book
Language:Inglés
Published: New York : Haworth 2003.
Subjects:
See on Universidad de Deusto:https://oceano.biblioteca.deusto.es/primo-explore/search?query=any,contains,991003714299703351&tab=default_tab&search_scope=deusto_alma&vid=deusto
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Description
Item Description:Fotocopia de: Latin American Business Review, v. 4, n. 2 (2003)
Physical Description:p. 37-53 : gráf. ; 30 cm
Bibliography:Bibliogr.: p. 52-53