Graham, S. J. H. (2002). Post-issue patent quality control: A comparative study of US patent re-examinations and European patent oppositions. National Bureau of Economic Research.
Chicago Style (17th ed.) CitationGraham, Stuart J. H. Post-issue Patent Quality Control: A Comparative Study of US Patent Re-examinations and European Patent Oppositions. Cambridge, MA: National Bureau of Economic Research, 2002.
MLA (9th ed.) CitationGraham, Stuart J. H. Post-issue Patent Quality Control: A Comparative Study of US Patent Re-examinations and European Patent Oppositions. National Bureau of Economic Research, 2002.
Warning: These citations may not always be 100% accurate.
