In-process machine degradation monitoring and fault detection using a neural network approach

Bibliographic Details
Main Author: Lee, Jay (-)
Format: Thesis
Language:Inglés
Published: Ann Arbor : University Microfilms International 1993.
Subjects:
See on Universidad de Deusto:https://oceano.biblioteca.deusto.es/primo-explore/search?query=any,contains,991002794359703351&tab=default_tab&search_scope=deusto_alma&vid=deusto
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Description
Physical Description:XII, 152 p. ; 20 cm
Bibliography:Bibliogr.: p. 118-126